Department of Applied Chemistry, School of Science and Technology, Meiji University

Scanning electron microscope (SEM)

X-ray diffractometer (XRD)

Fourier transform infrared spectrophotometer (FT-IR)

Surface area analyzer

Laser diffraction particle size analyzer

Surface roughness tester

Others

・ Universal Tester, SHIMADZU AGS-X
・ Hardness tester, SHIMADZU DUH-211
・ Ion slicer, JEOL ION SLICER EM-09100IS
・ Zeta-potential analyzer (Otsuka Electronics ELSZ-2)
・ Microfocus X-ray CT system (SHIMADZU inspeXio SMX-90CT)
・ Ball mill (FRITSCH Pulverisette P-6)
・ Inductively-coupled plasma atomic emission spectrometer (ICP-AES, SII NanoTechnology SPS7800)
・ Cell culture system
・ Fluorescence microscope(Olympus)
・ Flow cytometric analyzer
・ Cryostat (LEICA CM3050 S)
・ Hydrogen peroxide plasma gas sterilizer (J&J Sterrad NX)
・ EOG sterilizer