| 学術論文 16年〜17年 | 2020/4/21 更新 | ||||||
| 発行年月 | タイトル | 掲載紙名 | 第一著者 | 共著者 | 発行所 | 備考 | |
| 2016年1月 | Examination of phonon deformation potentials for accurate strain measurements in silicon–germanium alloys with the whole composition range by Raman spectroscopy | Jpn. J. App. Phys., 55, 026602（１-6) (2016). | 
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Shotaro Yamamoto, Kazuma Takeuchi, Koji Usuda, and Atsushi Ogura | IOP Science | ||
| 2016年3月 | Improving crystalline quality of sputtering-deposited MoS2 thin film by postdeposition sulfurization annealing using (t-C4H9)2S2 | Jpn. J. App. Phys., 55, 04EJ07 (2016) | Seiya Ishihara | Yusuke Hibino, Naomi Sawamoto, Kohei Suda, Takumi Ohashi, Kentarou Matsuura, Hideaki Machida, Masato Ishikawa, Hiroshi Sudoh, Hitoshi Wakabayashi and Atsushi Ogura | IOP Science | ||
| 2016年3月 | Investigation of new stacking surface passivation structures with interfacial tuning layers on p-type crystalline silicon | Jpn. J. App. Phys., 55, 04ES03 (2016) | Norihiro Ikeno | Taka-aki Katsumata, Haruhiko Yoshida, Koji Arafune, Shin-ichi Satoh, Toyohiro Chikyow, and Atsushi Ogura | IOP Science | ||
| 2016年4月 | Properties of single-layer MoS2 film fabricated by combination of sputtering deposition and post deposition sulfurization annealing using (t-C4H9)2S2 | Jpn. J. App. Phys., 55, 06GF01 (2016) | Seiya Ishihara | Yusuke Hibino, Naomi Sawamoto, Kohei Suda, Takumi Ohashi, Kentarou Matsuura, Hideaki Machida, Masato Ishikawa, Hiroshi Sudoh | IOP Science | ||
| 2016年4月 | Thin-film growth of (110) rutile TiO2 on (100) Ge substrate by pulsed laser deposition | Jpn. J. App. Phys., 55, 06GG06 (2016) | Yoshihisa Suzuki | Takahiro Nagata, Yoshiyuki Yamashita, Toshihide Nabatame, Atsushi Ogura, and Toyohiro Chikyow | IOP Science | ||
| 2016年4月 | Detection of short range order in SiO2 thin-films by grazing-incidence wide and small-angle X-ray scattering | J. Appl. Phys. 119, 154103 (2016). | Kohki Nagata | Atsushi Ogura, Ichiro Hirosawa, Tomoyuki Suwa, Akinobu Teramoto, and Tadahiro Ohmi | American Insistute of Physice | ||
| 2016年6月 | Origin of additional broad peaks in Raman spectra from thin germanium-rich silicon–germanium films | Applied Physics Express 9, 071301 (2016) | Kazuma Takeuchi | Daisuke Kosemura, Ryo Yokogawa, Koji Usuda, and Atsushi Ogura | IOP Science | ||
| 2016年8月 | Electrically active light-element complexes in silicon crystals grown by cast method | Jpn. J. App. Phys., 55, 095502 (2016) | Kuniyuki Sato | Atsushi Ogura, and Haruhiko Ono | IOP Science | ||
| 2016年8月 | Biaxial stress evaluation in GeSn film epitaxially grown on Ge substrate by oil-immersion Raman spectroscopy | Jpn. J. App. Phys., 55, 091301 (2016) | Kazuma Takeuchi | Kohei Suda, Ryo Yokogawa, Koji Usuda, Naomi Sawamoto1 and Atsushi Ogura | IOP Science | ||
| 2016年8月 | Minority Carrier Recombination Properties of Crystalline Defect on Silicon Surface Induced by Plasma Enhanced Chemical Vapor Deposition | ECS Journal of Solid State Science and Technology, 5 (9) Q253-Q256 (2016) | Tomihisa Tachibana | Daisuke Takai, Takuto Kojima, Takefumi Kamioka, Atsushi Ogura, and Yoshio Ohshita | Electrochemical Society | ||
| 2016年10月 | Prospectively of Carbon-Doped Indium-Tungsten-Oxide Channel TFT for Bias Stress Instability | ECS Transactions, 75, 149-156 (2016). | K. Kurishima | T. Nabatame, T. Kizu, N. Mitoma, K. Tsukagoshi, T. Sawada, A. Ohi, I. Yamamoto, T. Ohishi, T. Chikyow, and A. Ogura | Electrochemical Society | ||
| 2016年10月 | Development of Interatomic Potential of Group IV Alloy Semiconductors for Lattice Dynamics Simulation | ECS Transactions, 75, 785-794 (2016). | M. Tomita | A. Ogura, and T. Watanabe | Electrochemical Society | ||
| 2016年10月 | In-Plane Biaxial Strain Evaluation Induced in Ge1-XSnx Films Using Oil-Immersion Raman Spectroscopy | ECS Transactions, 75, 589-597 (2016). | K. Takeuchi | K. Suda, R. Suzuki, R. Yokogawa, N. Sawamoto, K. Usuda, and A. Ogura | Electrochemical Society | ||
| 2016年10月 | Role of High-k Interlayer in ZrO2/High-k/ZrO2 Insulating Multilayer on Electrical Properties for DRAM Capacitor | ECS Transactions, 75, 667-674 (2016). | T. Onaya | T. Nabatame, T. Sawada, K. Kurishima, N. Sawamoto, A. Ohi, T. Chikyow, and A. Ogura | Electrochemical Society | ||
| 2016年11月 | Effects of Aluminum in Metallization Paste on the Electrical Losses in Bifacial N-type Crystalline Silicon Solar Cells | Energy Procedia 98, 106 – 114 ( 2016 ) . | Takayuki Aoyama | Mari Aoki, Isao Sumita, Yasushi Yoshino, Atsushi Ogura | Elsevier B.V. | ||
| 2016年12月 | Role of H2 supply for Sn incorporations in MOCVD Ge1−xSnx epitaxial growth | J. Cryst. Growth, 468, 605–609 (2017) . | Kohei Suda | Naomi Sawamoto, Hideaki Machida, Masato Ishikawa, Hiroshi Sudoh, Yoshio Ohshita, Ichiro Hirosawa, Atsushi Ogura | Elsevier B.V. | ||
| 2017年3月 | Quantification of C in Si by photoluminescence at liquid N
temperature after electron irradiation |
Applied Physics Express 10, 046602 (2017) | Michio Tajima | Hirotatsu Kiuchi, Fumito Higuchi, and Atsushi Ogura | IOP Science | ||
| 2017年3月 | Quantitative relationship between sputter-deposited-MoS2
properties and underlying-SiO2 surface roughness |
Applied Physics Express 10, 041202-1-4 (2017). | Takumi Ohashi | Iriya Muneta, Kentaro Matsuura, Seiya Ishihara, Yusuke Hibino, Naomi Sawamoto, Kuniyuki Kakushima, Kazuo Tsutsui, Atsushi Ogura, and Hitoshi Wakabayashi | IOP Science | ||
| 2017年4月 | Pattern-dependent anisotropic stress evaluation in SiGe
epitaxially grown on a Si substrate with selective Ar+ ion implantation using oil-immersion Raman spectroscopy |
Jpn. J. App. Phys., 56, 051301-1-5 (2017). | Shotaro Yamamoto | Daisuke Kosemura, Kazuma Takeuchi, Seiya Ishihara, Kentarou Sawano, Hiroshi Nohira, and Atsushi Ogura | IOP Science | ||
| 2017年4月 | Effects of thermal budget in n-type bifacial solar cell fabrication processes on effective lifetime of crystalline silicon |
AIP ADVANCES 7, 045111-1-7 (2017). | Tomihisa Tachibana | Atsushi Ogura, Yoshio Ohshita, Takafumi Shimoda, Isao Masada, and Eiichi Nishijima | American Institute of Physics | ||
| 2017年6月 | Investigation of the static electric field effect of strontium
silicate layers on silicon substrates |
J. Appl. Phys., 121, 225302_1_6 (2017) | Shota Taniwaki | Keiji Imanishi, Mitsuhiro Umano, Haruhiko Yoshida, Koji Arafune, Atsushi Ogura, Shin-ichi Satoh, and Yasushi Hotta | American Institute of Physics | ||
| 2017年6月 | Determination of low carbon concentration in Czochralski-grown Si crystals for solar cells by luminescence activation using electron irradiation | Jpn. J. App. Phys., 55, 070305-1-3 (2016) | Hirotatsu Kiuchi | Michio Tajima, Fumito Higuchi, Atsushi Ogura, Nobuhito Iida, Shoji Tachibana, Isao Masada, and Eiichi Nishijima | IOP Science | ||
| 2017年6月 | Photoluminescence due to early stage of oxygen precipitation in multicrystalline Si for solar cells | Jpn. J. App. Phys., 55, 070308-1-3 (2016) | Fumito Higuchi | Michio Tajima, and Atsushi Ogura | IOP Science | ||
| 2017年7月 | Improvement in ferroelectricity of HfxZr1%xO2 thin films using ZrO2 seed layer | Applied Physics Express 10, 081501-1-4 (2017) | Takashi Onaya | Toshihide Nabatame, Naomi Sawamoto, Akihiko Ohi, Naoki Ikeda, Toyohiro Chikyow, and Atsushi Ogura | IOP Science | ||
| 2017年8月 | Band gap-tuned MoS2(1-x)Te2x thin films synthesized by a hybrid Co-sputtering and post-deposition tellurization annealing process | J. Mat. Res., 32, 3021-3028 (2017). | Yusuke Hibino | Seiya Ishihara, and Naomi Sawamoto, Takumi Ohashi, Kentarou Matsuura, Hideaki Machida, Hitoshi Wakabayashi, Atsushi Ogura | Mterial Research Society | ||
| 2017年8月 | Improvement of smooth surface of RuO2 bottom electrode on Al2O3 buffer layer and characteristics of RuO2/TiO2/Al2O3/TiO2/RuO2 capacitors | Journal of Vacuum Science & Technology , 35, 061503-1-7(2017). | Tomomi Sawada | Toshihide Nabatame, Thang Duy Dao, Ippei Yamamoto, Kazunori Kurishima, Takashi Onaya, Akihiko Ohi, Kazuhiro Ito, Makoto Takahashi, Kazuyuki Kohama, Tomoji Ohishi, Atsushi Ogura, Tadaaki Nagao | American Vacuum Society | ||
| 2017年10月 | Local anisotropic strain evaluation in thin Ge epitaxial film using SiGe stressor template grown on Ge substrate by selective ion implantation | Japanese Journal of Applied Physics 56, 110313-1-4 (2017) | Kazuma Takeuchi | Ryo Yokogawa, Seiya Ishihara, Shotaro Yamamoto, Shiori Konoshima, Kentarou Sawano, and Atsushi Ogura | IOP Science | ||
| 2017年11月 | Probing spatial heterogeneity in silicon thin films by Raman spectroscopy | Sci. Rep. 7, 16549(1-8) (2017). | Hideyuki Yamazaki | Mitsuo Koike, Masumi Saitoh, Mitsuhiro Tomita, Ryo Yokogawa, Naomi Sawamoto, Motohiro Tomita, Daisuke Kosemura, Atsushi Ogura | Springer Nature | ||