国際会議 18年〜19年 | 2020/4/21 更新 | |||||
発行年月 | タイトル | 第一著者 | 共著者 | 会議名 | 開催場所 | 備考 |
2018年1月15日 | Influence of Al2O3/In0.76Si0.24O0.99C0.01 Interface on Reliability for Oxide Thin Film Transistor | Kazunori Kurishima | T. Nabatame, T. Onaya, T. Kizu, K. Tsukagoshi, A. Ohi, N. Ikeda, T. Chikyow, A. Ogura | 45th Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-45) | Kona,HI | |
2018年1月15日 | Evaluation of Strain in the Oxide Covered Silicon Nanowires for Thermoelectric Devices by Raman Spectroscopy | Ryo Yokogawa |
S. Hashimoto, M. Tomita, T. Watanabe, A. Ogura | 45th Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-45) | Kona,HI | |
2018年3月12日 | Chip-Level-Integrated nMISFETs with Sputtered-Deposited-MoS2 Thin Channel Passivated by Al2O3 Film and TiN Top Gate | Kentaro Matsuura, | Jun’ichi Shimizu, Mayato Toyama, Takumi Ohashi, Iriya Muneta, Seiya Ishihara1, Kuniyuki Kakushima, Kazuo Tsutsui, Atsushi Ogura1 and Hitoshi Wakabayashi | 2nd Electron Devices Technology and Manufacturing (EDTM) Conference 2018 | Kobe, Japan | |
2018年3月14日 | PRESENT STATUS AND FUTURE OF R&D FOR CRYSTALLINE SILICON SOLAR CELLS | Yoshio Ohshita | Atsushi Ogura | Global Photovoltaic Conference 2018 | Gwangju, Korea | |
2018年3月20日 | 100μm Thin n-Type Bifacial PERT Cell Using 200μm Pitch Diamond Multi-Wire Slice Wafer |
Yoshio Ohshita | Atsushi Ogura | 8th International Conference on Silicon Photovoltaics, and the nPV Workshop | Lauzsanne, Switzerland | |
2018年3月20日 | 3D scaling of Si-IGBT | H. Iwai | K. Kakushima, T. Hoshii, K. Tsutsui, A. Nakajima, S. Nishizawa, H. Wakabayashi, I. Muneta, K. Sato, T. Matsudai, W. Saito, T. Saraya, K. Itou, M. Fukui, S. Suzuki, M. Kobayashi, T. Takakura, T. Hiramoto, A. Ogura, Y. Numasawa, I. Omura and H. Ohash | Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon | Granada, Spain | |
2018年6月11日 | Machine Learning for Automated Etch Pit Counting on As-sliced Surface of Multicrystalline Silicon | Takuto Kojima | Kohei Onishi, Atsushi Ogura, Kenji Fukui, Manabu Komoda, Junichi Atobe | 7th World Conference on Photovoltaic Energy Conversion | Waikoloa, HI | |
2018年6月11日 | Evaluation of lifetime degradation caused by oxygen precipitation combined with metal contamination in Cz-Si for solar cells | Kouhei Onishi | Takuto Kojima, Kousuke Kinoshita, Yoshio Oshita, Atsushi Ogura | 7th World Conference on Photovoltaic Energy Conversion | Waikoloa, HI | |
2018年6月13日 | Effect of ITO Capping Layer on Interface Workfunction of MoOx in ITO/MoOx/SiO2/Si Contacts | Takefumi Kamioka | Yutaka Hayashi, Yuki Isogai, Kyotaro Nakamura, Yoshio Ohshita, Atsushi Ogura | 7th World Conference on Photovoltaic Energy Conversion | Waikoloa, HI | |
2018年6月13日 | Potential of Chemical Rounding for the Performance Enhancement of a Monolithic Perovskite/Bifacial N-PERT Si Tandem Cell | Hyunju Lee | , Inseol Song, Sang-Won Lee, Soo Hyun Bae, Ji Yeon Hyun, Yoonmook Kang, Haeseok Lee, Donghwan Kim, Atsushi Ogura, Yoshio Ohshita | 7th World Conference on Photovoltaic Energy Conversion | Waikoloa, HI | |
2018年6月13日 | Evaluation of ITO/a-Si properties by hard X-ray photoemission spectroscopy | Tappei Nishihara | Takuya Hiyama, Takuto Kojima, Hideki Matsumura, Takefumi Kamioka, Yoshio Ohshita, Satoshi Yasuno, Ichiro Hirosawa, Atsushi Ogura | 7th World Conference on Photovoltaic Energy Conversion | Waikoloa, HI | |
2018年6月13日 | Influence of Additives in the Electrode Paste for Crystalline Si Solar Cells on Potential-Induced Degradation | Sachiko Jonai | Aki Tanaka, Kazuo Muramatsu, Kyotaro Nakamura, Atsushi Ogura, Yoshio Ohshita, Atsushi Masuda | 7th World Conference on Photovoltaic Energy Conversion | Waikoloa, HI | |
2018年6月20日 | New Methodology for Evaluating Minority Carrier Lifetime for Process Assessment | K. Kakushima | T. Hoshii, M. Watanabe, N. Shigyo, K. Furukawa, T. Saraya, T. Takakura, K. Itou, M. Fukui, S. Suzuki, K. Takeuchi, I. Muneta, H. Wakabayashi, Y. Numasawa, A. Ogura, S. Nishizawa, K. Tsutsui, T. Hiramoto, H. Ohashi, and H. Iwai | 2018 Symposia on VLSI Technology and Circuits | Honolulu, HI | |
2018年7月31日 | Effect of ZrO2 Capping-layer on Ferroelectricity of HfxZr1−xO2 Thin Films by ALD using Hf/Zr Cocktail Precursor | Takashi Onaya | T. Nabatame, N. Sawamoto, A. Ohi, N. Ikeda, T. Chikyow, and A. Ogura, | AVS 18th International Conference on Atomic Layer Deposition | Incheon, South Korea | |
2018年8月13日 | Suppression of Oxygen Precipitation and Dislocation Formation by Controlling Thermal History for Cz-Si Crystal Growth | Kosuke Kinoshita | Takuto Kojima, Kohei Onishi, Yoshio Ohshita, and Atushi Ogura | 28th Workshop on Crystalline Silicon Sola Cells & Modules: Materiafs and Processes | Winter Park, CO | |
2018年8月14日 | Quantification Low-level Carbon in Silicon Crystals by Room-Temperature Photoluminescence after Electron Irradiation | Yoichiro Ishikawa | Michio Tajima, and Atsushi Ogura | 28th Workshop on Crystalline Silicon Sola Cells & Modules: Materiafs and Processes | Winter Park, CO | |
2018年8月14日 | Lifetime Degradation Caused by Oxygen Precipitation Combined with Metal Contamination in Cz-Si for Solar Cells | Kohei Onishi | Kosuke Kinoshita, Takuto Kojima, Yoshio Ohshita, and Atsushi Ogura | 28th Workshop on Crystalline Silicon Sola Cells & Modufes: Materiafs and Processes | Winter Park, CO | |
2018年9月12日 | Quantitative Analysis of Low-level Carbon in Si Using Room-Temperature Photoluminescence after Electron Irradiation | Yoichiro Ishikawa | Michio Tajima, and Atsushi Ogura | 2018 International Conference on Solid State Devices and Materials | Tokyo, Japan | |
2018年9月12日 | Effects of Crystal Growth Conditions of n-type Cz-Si for Solar cells on Oxygen Precipitation and Dislocation Formation through Annealing Process | Kosuke Kinoshita | Takuto Kojima, Kohei Onishi, Yoshio Ohshita, and Atushi Ogura | 2018 International Conference on Solid State Devices and Materials | Tokyo, Japan | |
2018年9月12日 | Effects of Metal Contamination with Oxygen Precipitates on Lifetime Degradation in Cz-Si for Solar Cells | Kohei Onishi | Takuto Kojima, Kosuke Kinoshita, Yoshio Ohshita, and Atsushi Ogura | 2018 International Conference on Solid State Devices and Materials | Tokyo, Japan | |
2018年9月12日 | Evaluations of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT Processes | H. Kobayashi | R. Yokogawa, K. Kinoshita, Y. Numasawa, A. Ogura, S. Nishizawa, T. Saraya, K. Ito, T. Takakura, S. Suzuki, M. Fukui, K. Takeuchi, and T. Hiramoto | 2018 International Conference on Solid State Devices and Materials | Tokyo, Japan | |
2018年9月13日 | Impact of Top-ZrO2 Nucleation Layer on Ferroelectricity of HfxZr1-xO2 Thin Films for Ferroelectric Field Effect Transistor Application | Takashi Onay | Toshihide Nabatame, Naomi Sawamoto, Akihiko Ohi, Naoki
Ikeda, Takahiro Nagata, and Atsushi Ogura |
2018 International Conference on Solid State Devices and Materials | Tokyo, Japan | |
2018年9月13日 | Crystal Growth of MnS buffer layer for non-polar AlN on Si (100) deposited by RF-magnetron sputtering | Kouta Tatejima | Takahiro Nagata, Keiji Ishibashi, Kenichiro Takahashi, Setsu Suzuki, Atsushi Ogura, and Toyohiro Chikyow | 2018 International Conference on Solid State Devices and Materials | Tokyo, Japan | |
2018年9月24日 | Potential of Chemical Rounding for the Performance
Enhancement of a Pyramid- Textured Bifacial Si Bottom Cell |
H. Lee | Y. Ohshita, I. Song, S.W. Lee, S.H. Bae, J.Y. Hyun, Y. Kang, H. Lee, D. Kim, and A. Ogura | 35th European PV Solar Energy Conference and Exibition | Brussels, Belgium | |
2018年9月27日 | Image Recognition of Etch Pits on As-Sliced Surface of
Multicrystalline Silicon Using Machine Learning |
T. Kojima, | K. Onishi, and A. Ogura | 35th European PV Solar Energy Conference and Exibition | Brussels, Belgium | |
2018年9月30日 | Strain Evaluation of Laser-Annealed SiGe Thin Layers | S. Komago | T. Murakami, K. Yoshioka, R. Yokogawa, A. Ogura, J. O. Borland, T. Kuroi, T. Tabata, K. Huet, and N. Horiguchi | The 234th Meeting of The Electrochemical Society (ECS), the XXXIII Congreso de la Sociedad Mexicana de Electroquimica (SMEQ), and the 11th Meeting of the Mexico Section of the Electrochemical Society | Cancun, Mexico | |
2018年10月1日 | Ferroelectricity of HfxZr1−xO2 Thin Films Fabricated Using TiN Stressor and ZrO2 Nucleation Techniques | T. Onaya | T. Nabatame, N. Sawamoto, K. Kurishima, A. Ohi, N. Ikeda, T. Nagata, and A. Ogura | the 234th Meeting of The Electrochemical Society (ECS), the XXXIII Congreso de la Sociedad Mexicana de Electroquimica (SMEQ), and the 11th Meeting of the Mexico Section of the Electrochemical Society | Cancun, Mexico | |
2018年10月2日 | Evaluation of Laterally Graded Silicon Germanium Wires for Thermoelectric Devices Fabricated by Rapid Melting Growth | R. Yokogawa | S. Hashimoto, K. Takahashi, S. Oba, M. Tomita, M. Kurosawa, T. Watanabe, and A. Ogura | the 234th Meeting of The Electrochemical Society (ECS), the XXXIII Congreso de la Sociedad Mexicana de Electroquimica (SMEQ), and the 11th Meeting of the Mexico Section of the Electrochemical Society | Cancun, Mexico | |
2018年10月2日 | Reliability of Al2O3/In-Si-O-C thin-film transistors with an Al2O3 passivation layer under negative gate-bias stress |
K. Kurishima | T. Nabatame, T. Onaya, K. Tsukagoshi, A. Ohi, N. Ikeda, T. Nagata, and A. Ogura | the 234th Meeting of The Electrochemical Society (ECS), the XXXIII Congreso de la Sociedad Mexicana de Electroquimica (SMEQ), and the 11th Meeting of the Mexico Section of the Electrochemical Society | Cancun, Mexico | |
2018年10月3日 | Evaluation of Anisotropic Three-Dimensional Strain Relaxation in Stripe-Shaped Ge1-xSnx Mesa Structure | Y. Takahashi | R. Yokogawa, T. Murakami, I. Hirosawa, K. Suda, and A. Ogura | the 234th Meeting of The Electrochemical Society (ECS), the XXXIII Congreso de la Sociedad Mexicana de Electroquimica (SMEQ), and the 11th Meeting of the Mexico Section of the Electrochemical Society | Cancun, Mexico | |
2018年10月4日 | High-Sn Concentration MOCVD-Grown Strained GeSn Thin Films Evaluated Using HAXPES and XRD Base on Synchrotron Technique | K. Usuda | M. Yoshiki , K. Suda, A. Ogura, and M. Tomita | the 234th Meeting of The Electrochemical Society (ECS), the XXXIII Congreso de la Sociedad Mexicana de Electroquimica (SMEQ), and the 11th Meeting of the Mexico Section of the Electrochemical Society | Cancun, Mexico | |
2018年10月4日 | Determination of Phonon Deformation Potentials in Carbon-doped Silicon | K. Yoshioka | R. Yokogawa, T. Murakami, S. Komago, N. Sawamoto, and A. Ogura | the 234th Meeting of The Electrochemical Society (ECS), the XXXIII Congreso de la Sociedad Mexicana de Electroquimica (SMEQ), and the 11th Meeting of the Mexico Section of the Electrochemical Society | Cancun, Mexico | |
2018年11月15日 | Evaluation of MoS2 Film Fabricated by DC Bias Sputtering Method with Raman Spectroscopy | Y. Oyanagi | S. Ishihara, Y. Hibino, N. Sawamoto, T. Ohashi, K. Matsuura, H. Wakabayashi, and A. Ogura | 31st International Microprocesses and Nanotechnology Conference | Ssappro, Japan | |
2018年11月16日 | Evaluation of Thermal Conductivity Characteristics in Si Nanowire Covered with Oxide by UV Raman Spectroscopy |
R. Yokogawa | M. Tomita, T. Watanabe, and A. Ogura | 31st International Microprocesses and Nanotechnology Conference | Ssappro, Japan | |
2018年11月16日 | Effect of Substrate Self-Bias and Nitrogen Flow Rate on Non-Polar AIN Film Growth by Reactive Sputtering | K. Tatejima | T. Nagata, K. Ishibashi, K. Takahashi, S. Suzuki, A. Ogura, and T. Chikyow | 31st International Microprocesses and Nanotechnology Conference | Ssappro, Japan | |
2018年11月19日 | Error Factors in Carbon Quantitative Analysis in Si using Room-Temperature Photoluminescence after Electron Irradiation | Yoichiro Ishikawa | Michio Tajima, and Atsushi Ogura | The Forum on the Science and Technology of Silicon Materials 2018 | Okayama, Japan | |
2018年11月19日 | Minority carrier lifetime degradation in FZ-Si by advanced Si-IGBT processes | H. Kobayashi | R. Yokogawa, K. Kinoshita, Y. Numasawa, A. Ogura, S.
Nishizawa, T. Saraya, K. Ito, T. Takakura, S. Suzuki, M. Fukui, K.
Takeuchi, and T. Hiramoto |
The Forum on the Science and Technology of Silicon Materials 2018 | Okayama, Japan | |
2018年11月19日 | Characterization of electrical properties in carrier selective contact solar cells | Yoshio Ohshita | Takefumi Kamioka, Lee Hyunju, Yutaka Hayashi, Kyotaro Nakamura, and Atsushi Ogura | The Forum on the Science and Technology of Silicon Materials 2018 | Okayama, Japan | |
2018年11月21日 | Research on crystalline Si solar cells by universities in Japan under NEDO support | A. Ogura | Y. Ohshita | The Forum on the Science and Technology of Silicon Materials 2018 | Okayama, Japan | |
2018年12月3日 | Demonstration of 1200V Scaled IGBTs Driven by 5V Gate Voltage with Superiorly Low Switching Loss, | T. Saraya | K. Itou, T. Takakura, M. Fukui, S. Suzuki, K. Takeuchi, M. Tsukuda, Y. Numasawa, K. Satoh, T. Matsudai, W. Saito, K. Kakushima, T. Hoshii, K. Furukawa, M. Watanabe, N. Shigyo, K. Tsutsui, H. Iwai, A. Ogura, S. Nishizawa, I. Omura, H. Ohashi, and T. Hiramoto | 2018 IEEE International Electron Devices Meeting | San Francisco, CA | |
2019年3月5日 | Non-polar AlN growth on Si (100) substrate with MnS buffer layer deposited by sputtering | K. Tatejima | T. Nagata, K. Ishibashi, K. Takahashi, S. Suzuki, A. Ogura, and T. Chikyow | 12th MANA International Symposium | Tsukuba, Japan | |
2019年3月13日 | Suppression of threshold voltage shift on In-Si-O-C Thin-Film Transistor with an Al2O3 Passivation Layer under Negative and Positive Gate-Bias Stress | Kazunori Kurishima | Toshihide Nabatame, Takashi Onaya, Kazuhito Tsukagoshi, Akihiko Ohi, Naoki Ikeda, Takahiro Nagata, and Atsushi Ogura | 2019 IEEE Electron Devices Technology and Manufacturing Conference | Singapore | |
2019年3月13日 | Defect Formation by Indium-tin Oxide Reactive Plasma Deposition | Yoshio Ohshita | Yuki Isogai, Lee Hyunju, Tomohiko Hara, Takefumi Kamioka, and Atsushi Ogura | Global Photovoltaic Conference 2019 | Gwangju, Korea | Ivited |
2019年3月14日 | Fabrication of MoS2(1-x)Te2x via Sulfurization using (t-C4H9)2S2 and its Physical Structure Evaluation | Yusuke Hibino | Seiya Ishihara, Yuya Oyanagi, Kota Yamazaki, Yusuke Hashimoto, Naomi Sawamoto, Hideaki Machida, Masato Ishikawa, Hiroshi Sudoh, Hitoshi Wakabayashi, and Atsushi Ogura | 2019 IEEE Electron Devices Technology and Manufacturing Conference | Singapore | |
2019年3月14日 | Control of Oxygen Pricipitation in Cz-Silicon for High Efficiency Solar Cells | Atsushi Ogura | Kohei Onishi, Kosuke Kinoshita, and Yoshio Ohshita | Global Photovoltaic Conference 2019 | Gwangju, Korea | Ivited |
2019年5月20日 | 3300V Scaled IGBTs Driven by 5V Gate Voltage | Takuya Saraya | Kazuo Itou, Toshihiko Takakura, Munetoshi Fukui, Shinichi
Suzuki, Kiyoshi Takeuchi, Masanori Tsukuda, Yohichiroh Numasawa, Katsumi
Satoh, Tomoko Matsudai, Wataru Saito, Kuniyuki Kakushima, Takuya Hoshii,
Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Hitoshi Wakabayashi,
Kazuo Tsutsui, Hiroshi Iwai, Atsushi Ogura, and Shin-Ichi Nishizawa , Ichiro Omura, Hiromichi Ohashi, Toshiro Hiramot |
31st IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD) | Shanghai, China | |
2019年5月28日 | Investigation on the Stability of MoS2(1-x)Te2x Fabricated By Tellurization Using Organic Precursor (i-C3H7)2Te | Y. Hibino, | S. Ishihara, K. Yamazaki, Y. Oyanagi, Y. Hashimoto, N. Sawamoto, H. Machida, M. Ishikawa, H. Sudoh, H. Wakabayashi, and A. Ogura | 235th Electrochemical Society Meeting | Dallas, TX | |
2019年6月6日 | Normally-Off Sputtered-MoS2 nMISFETs with MoSi2 Contact by Sulfur Powder Annealing and ALD Al2O3 Gate Dielectric for Chip Level Integration | K. Matsuura | M. Hamada, T. Hamada, H. Tanigawa, T. Sakamoto, W. Cao, K . Parto, A. Hori, I. Muneta, T. Kawanago, K. Kakushima, K. Tsutsui, A. Ogura, K. Banerjee, and H.Wakabayashi | 19th International Workshop on Junction Technology | Kyoto, Japan | |
2019年6月18日 | Ultra-Thin Lightweight Bendable Crystalline Si Solar Cells for Solar Vehicles | Yoshio Ohshita | Kohei Onishi, Ryo Yokogawa, Tappei Nishihara, Takefumi Kamioka, Kyotaro Nakamura, Tomoyuki Kawatsu, Toshiki Nagai, Noboru Yamada, Yukio Miyashita, and Atsushi Ogura | 46th IEEE Photovoltaic Specialists Conference | Chicago, IL | |
2019年6月20日 | Evaluated of ITO/a-Si interface fabricated by RPD technique | Tappei Nishihara | Takefumi Kamioka, Hiroki Kanai, Yoshio Ohshita, Hideki Matsumura, Satoshi Yasuno, Ichiro Hirosawa, and Astushi Ogura | 46th IEEE Photovoltaic Specialists Conference | Chicago, IL | |
2019年7月10日 | Growth condition optimization of non-polar AlN on sapphire substrate deposited by reactive RF sputtering | Kota Tatejima | Kazunori Kurishima, Keiji Ishibashi, Kenichiro Takahashi, Setsu Suzuki, Atsushi Ogura, Toyohiro Chikyow, and Takahiro Nagata | The 11th International Conference on the Science and Technology for Advanced Ceramics | Tsukuba, Japan | |
2019年8月5日 | Evaluation of process damage induced by transparent conductive oxide film deposition for silicon heterojunction solar cells | Hiroki Kanai | Tappei Nishihara, Takefumi Kamioka, Junsuke Matsuzaki, Hirohisa Takahashi, Junya Kiyota, Satoshi Yasuno, Ichiro Hirosawa, and Atsushi Ogura | 29th Annual NREL Silicon Workshop | Winter Park, Colorado | |
2019年8月7日 | Effects of Phosphorus Doping in Si substrates on the Band Alignment and Electrical Performance of TiO 2 Electron Selective Contacts | Hyunju Lee | Takefumi Kamioka, Atsushi Ogura, and Yoshio Ohshita | 29th Annual NREL Silicon Workshop | Winter Park, Colorado | |
2019年10月30日 | Switching of 3300V Scaled IGBT by 5V Gate Drive | T. Hiramoto | T. Saraya, K. Itou, T. Takakura, M. Fukui, S. Suzuki, K. Takeuchi, M. Tsukuda, Y. Numasawa, K. Satoh, T. Matsudai, W. Saito, K. Kakushima, T. Hoshii, K. Furuka wa, M. Watanabe, N. Shigyo, H. Wakabayashi, K. Tsutsui, H. Iwai, A. Ogura, S. Nishizawa, I. Omura, and H. Ohash | 13th International Conference on ASIC (ASICON 2019) | Chongqing, China | Inveited |
2019年10月30日 | Temperature and Polarity Dependence of Electrical Properties of ZnO Film on Pyroelectric LiNbO3 Single Crystal | Y. Yasuhara | K. Kurishima, T. Chikyow, A. Ogura, and T. Nagata | 32nd International Microprocesses and Nanotechnology Conference | Hiroshima, Japa | |
2019年10月30日 | Stress Evaluation Induced by Wiggling SiN Fine Patternby Using Raman Spectroscopy | M. Koharada | R. Yokogawa, N. Sawamoto, K. Yoshioka, and A. Ogura | 32nd International Microprocesses and Nanotechnology Conference | Hiroshima, Japa | |
2019年10月30日 | Band Alignment at Non-Polar AlN/MnS Interface Investigated by Hard X-ray Photoelectron Spectroscopy | K. Kurishima | K. Tatejima, Y. Yamashita, S. Ueda, K. Ishibashi, K. Takahashi, S. Suzuki, A. Ogura, T. Chikyow, and T. Nagata | 32nd International Microprocesses and Nanotechnology Conference | Hiroshima, Japa | |
2019年11月5日 | Characterization of Bendable Crystalline Si Solar Cells Made by Ultra-thin Wafer Slicing | N. Yamada | K. Onishi, R. Yokogawa, T. Nishihara, T. Kamioka, K.
Nakamura, T. Kawatsu, T. Nagai, Y. Kotake, Y. Miyashita, Y. Ohshita, and A. Ogura |
the 29th International Photovoltaic Science and Engineering Conference (PVSEC29 | Xi'an, China | |
2019年11月5日 | New Analysis Method to Evaluate Amorphous/Crystalline Si Interface for High Efficiency Heterojunction Solar Cells | Takefumi Ka | Yutaka Hayashi, Kazuhiro Gotoh, Ryo Ozaki, Motoo Morimura, Ayako Shimizu, Kyotaro Nakamura, Noritake Usami, Yoshio Ohshita, and Atsushi Ogura | the 29th International Photovoltaic Science and Engineering Conference (PVSEC29 | Xi'an, China | |
2019年11月7日 | Evaluation of plasma induced damage in Silicon substrate by solar cell fabrication process | K. Onishi | Y. Hara, T. Nishihara, H. Kanai, T. Kamioka, Y. Ohshita, and A. Ogura | the 29th International Photovoltaic Science and Engineering Conference (PVSEC29 | Xi'an, China | |
2019年11月8日 | High Mobility Transparent Conductive Oxide Film for Silicon Heterojunction Solar Cell | Tappei Nishihara | Hiroki Kanai, Takefumi Kamioka, Junsuke Matsuzaki, Junya Kiyota, Yoshio Ohshita, Kyotaro Namakura, Satoshi Yasuno, Ichiro Hirosawa4 Toshiro Okawa, and Atsushi Ogura | the 29th International Photovoltaic Science and Engineering Conference (PVSEC29 | Xi'an, China | |
2019年11月18日 | Non-destructive Evaluation of Chemical Bonding States at Buried Interface using Laboratory Hard X-ray Photoelectron Spectroscopy | Tappei Nishihara | Hiroki Kanai, Toshiro Okawa, and Atsushi Ogura | 2019 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES: SCIENCE AND TECHNOLOGY Technical Program | Tokyo, Japan | |
2019年11月19日 | Characteristics of Oxide TFT with Amorphous Carbon-Doped In2O3 Channel Using 150 ºC Low Temperature Process with ALD and O3 Annealing | Riku Kobayash | Toshihide Nabatame, Kazunori Kurishima, Takashi Onaya, Akihiko Ohi, Naoki Ikeda, Takahiro Nagata, Kazuhito Tsukagoshi, and Atsushi Ogura | 2019 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES: SCIENCE AND TECHNOLOGY Technical Program | Tokyo, Japan | |
2019年11月27日 | Strain Evaluation of Laser-annealed or RTA Sn-doped SiGe Layers | Shota Komago | Ryo Yokogawa, Kazutoshi Yoshioka, Naomi Sawamoto, John O. Borland, Takashi Kuroi, Yoji Kawasaki, and Atsushi Ogura | 8th International Symposium on Control of Semiconductor Interfaces | Sendai, Japan | |
2019年12月3日 | Evaluation of Film Quality for Various Deposition Conditions of MOCVD MoS2 Films Fabricated with a Novel Mo Precursor i-Pr2DADMo(CO)3 | Kota Yamazaki | Yusuke Hibino, Yuya Oyanagi, Yusuke Hashimoto, Naomi Sawamoto, Hideaki Machida, Masato Ishikawa, Hiroshi Sudo, Hitoshi Wakabayashi, and Atsushi Ogura | 2019 MRS Fall Meeting & Exhibit | Boston, MA | |
2019年12月3日 | The Physical and Chemical Properties of MoS2(1-x)Te2x Alloy Synthesized by Co-Sputtering and Chalcogenization and Their Dependence on Fabrication Conditions | Yusuke Hibino | Kota Yamazaki, Yusuke Hashimoto, Yuya Oyanagi, Naomi Sawamoto, Hideaki Machida, Masato Ishikawa, Hiroshi Sudo, Hitoshi Wakabayashi, and Atsushi Ogura | 2019 MRS Fall Meeting & Exhibit | Boston, MA | |
2019年12月12日 | Reliability of Ferroelectric HfxZr1xO2 Thin Films
Using 300C Low Temperature Process with Plasma-Enhanced Atomic Layer Deposition, |
T. Onaya | T. Nabatame, Y. C. Jung, H. Hernandez-Arriaga, J. Mohan, H. S. Kim, A. Khosravi, N. Sawamoto, T. Nagata, R. M. Wallace, J. Kim, and A. Ogura | 50th IEEE Semiconductor Interface Specialists Conference | San Diego, CA |